<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-19T05:23:28Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/99001" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/99001</identifier><datestamp>2022-01-28T15:02:00Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Bruce Cameron and Tauhid Zaman.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Fuller, Stephen Patrick</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Leaders for Global Operations Program.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department" lang="en_US">Leaders for Global Operations Program at MIT</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Engineering Systems Division</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Sloan School of Management</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2015-09-29T18:57:40Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2015-09-29T18:57:40Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2015</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2015</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">http://hdl.handle.net/1721.1/99001</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">921182501</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis: M.B.A., Massachusetts Institute of Technology, Sloan School of Management, 2015. In conjunction with the Leaders for Global Operations Program at MIT.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis: S.M., Massachusetts Institute of Technology, Engineering Systems Division, 2015. In conjunction with the Leaders for Global Operations Program at MIT.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Cataloged from PDF version of thesis.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (pages 70-71).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">Statistical Process Control (SPC) has been applied to manufacturing processes for several decades as a means of ensuring product quality and has become a primary tool for the application of continuous improvement efforts. Continued Process Verification (CPV) is a Food and Drug Administration requirement that requires biopharmaceutical companies, such as Amgen, Inc., to demonstrate control of commercial manufacturing processes. Furthermore, the Food and Drug Administration's guidance on CPV specifically calls for the use of SPC. This thesis suggests including the use of the Akaike information criteria (AIC), a recognized statistical model selection criterion, for objective model selection for the purpose of establishing the most representative control limits in the application of SPC. The most representative control limits are instrumental in eliminating unnecessary use of resources in the evaluation of manufacturing data. Thus, the use of AIC is one way to reduce waste in the entire process of monitoring the manufacturing process, evaluating data, and making improvements to the manufacturing process. In addition, this thesis forms several key concepts for effective use of SPC and continuous improvement efforts when working with contract manufacturing organizations (CMOs). Finally, this thesis will discuss the applicability of the work done related to SPC as the foundation for effectively monitoring, evaluating and improving the manufacturing process.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Stephen Patrick Fuller.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">M.B.A.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">S.M.</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">71 pages</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri" lang="en_US">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Sloan School of Management.</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Engineering Systems Division.</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Leaders for Global Operations Program.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Leveraging Statistical Process Control for continuous improvement of the manufacturing process</dim:field>
   <dim:field mdschema="dc" element="title" qualifier="alternative" lang="en_US">Leveraging SPC for continuous improvement of the manufacturing process</dim:field>
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   	&lt;Title>Leveraging Statistical Process Control for continuous improvement of the manufacturing process&lt;/Title>
   	&lt;Subtitle>Leveraging SPC for continuous improvement of the manufacturing process&lt;/Subtitle>
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   	&lt;PublicationDate>2015&lt;/PublicationDate>
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   	&lt;Abstract>Statistical Process Control (SPC) has been applied to manufacturing processes for several decades as a means of ensuring product quality and has become a primary tool for the application of continuous improvement efforts. Continued Process Verification (CPV) is a Food and Drug Administration requirement that requires biopharmaceutical companies, such as Amgen, Inc., to demonstrate control of commercial manufacturing processes. Furthermore, the Food and Drug Administration&amp;apos;s guidance on CPV specifically calls for the use of SPC. This thesis suggests including the use of the Akaike information criteria (AIC), a recognized statistical model selection criterion, for objective model selection for the purpose of establishing the most representative control limits in the application of SPC. The most representative control limits are instrumental in eliminating unnecessary use of resources in the evaluation of manufacturing data. Thus, the use of AIC is one way to reduce waste in the entire process of monitoring the manufacturing process, evaluating data, and making improvements to the manufacturing process. In addition, this thesis forms several key concepts for effective use of SPC and continuous improvement efforts when working with contract manufacturing organizations (CMOs). Finally, this thesis will discuss the applicability of the work done related to SPC as the foundation for effectively monitoring, evaluating and improving the manufacturing process.&lt;/Abstract>
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