2026-09-23T04:36:36Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/99522022-01-13T07:54:29Zcom_1721.1_7582com_1721.1_7581col_1721.1_131022
Raymond C. Ashoori and Henry I. Smith.
Berman, David, 1968-
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2005-08-19T14:29:35Z
2005-08-19T14:29:35Z
1998
1998
http://hdl.handle.net/1721.1/9952
40335700
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998.
Includes bibliographical references (leaves 129-137).
by David Berman.
Ph.D.
137 leaves
7296668 bytes
7296426 bytes
application/pdf
application/pdf
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science
The aluminum single-electron transistor for ultrasensitive electrometry of semiconductor quantum-confined systems
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