| dc.contributor.advisor | John Kassakian and Anant Balakrishnan. | en_US |
| dc.contributor.author | Soederberg, Eric Martin | en_US |
| dc.date.accessioned | 2005-08-15T19:29:42Z | |
| dc.date.available | 2005-08-15T19:29:42Z | |
| dc.date.copyright | 1992 | en_US |
| dc.date.issued | 1992 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/12889 | |
| dc.description | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1992 and Thesis (M.S)--Sloan School of Management, 1992. | en_US |
| dc.description | Includes bibliographical references (p. 72-73). | en_US |
| dc.description.statementofresponsibility | by Eric Martin Soederberg. | en_US |
| dc.format.extent | 78 p. | en_US |
| dc.format.extent | 5847950 bytes | |
| dc.format.extent | 5847708 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
| dc.subject | Electrical Engineering and Computer Science | en_US |
| dc.subject | Sloan School of Management | en_US |
| dc.title | Using defect data to characterize assembly process capabilities and constraints for printed-circuit-board design for assembly | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | M.S | en_US |
| dc.description.degree | M.S. | en_US |
| dc.contributor.department | Sloan School of Management | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| dc.identifier.oclc | 27828606 | en_US |
