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1/f noise in MOSFETs with ultrathin gate dielectrics

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dc.contributor.advisor Charles G. Sodini. en_US
dc.contributor.author Gross, Blaine Jeffrey en_US
dc.date.accessioned 2005-08-15T16:49:31Z
dc.date.available 2005-08-15T16:49:31Z
dc.date.copyright 1992 en_US
dc.date.issued 1992 en_US
dc.identifier.uri http://hdl.handle.net/1721.1/13192
dc.description Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1992. en_US
dc.description Includes bibliographical references (p. 176-184). en_US
dc.description.statementofresponsibility by Blaine Jeffrey Gross. en_US
dc.format.extent 230 p. en_US
dc.format.extent 15757829 bytes
dc.format.extent 15757585 bytes
dc.format.mimetype application/pdf
dc.format.mimetype application/pdf
dc.language.iso eng en_US
dc.publisher Massachusetts Institute of Technology en_US
dc.rights M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. en_US
dc.rights.uri http://dspace.mit.edu/handle/1721.1/7582
dc.subject Electrical Engineering and Computer Science en_US
dc.title 1/f noise in MOSFETs with ultrathin gate dielectrics en_US
dc.type Thesis en_US
dc.description.degree Ph.D. en_US
dc.contributor.department Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science en_US
dc.identifier.oclc 26680871 en_US


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