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dc.contributor.advisorRobert P. Goldberg.en_US
dc.contributor.authorHansen, Mark Daviden_US
dc.date.accessioned2005-08-10T23:42:07Z
dc.date.available2005-08-10T23:42:07Z
dc.date.copyright1991en_US
dc.date.issued1991en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/13812
dc.descriptionThesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1991.en_US
dc.descriptionIncludes bibliographical references (leaves 143-145).en_US
dc.description.statementofresponsibilityby Mark David Hansen.en_US
dc.format.extent145 leavesen_US
dc.format.extent10330805 bytes
dc.format.extent10330561 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectSloan School of Managementen_US
dc.titleZero defect dataen_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentSloan School of Managementen_US
dc.identifier.oclc24537126en_US


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