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An analysis of second phase particles in zircaloy 2

dc.contributor.advisorRegis M.N. Pelloux and John B. Vander Sande.en_US
dc.contributor.authorChemelle, Pierre Leon Jacquesen_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Materials Science and Engineering.en_US
dc.date.accessioned2005-08-04T16:32:27Z
dc.date.available2005-08-04T16:32:27Z
dc.date.copyright1980en_US
dc.date.issued1980en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/16124
dc.descriptionThesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1980.en_US
dc.descriptionMICROFICHE COPY AVAILABLE IN ARCHIVES AND SCIENCE.en_US
dc.descriptionIncludes bibliographical references.en_US
dc.description.statementofresponsibilityby Pierre Leon Jacques Chemelle.en_US
dc.format.extent110 leavesen_US
dc.format.extent7718310 bytes
dc.format.extent7718067 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectMaterials Science and Engineering.en_US
dc.subject.lcshZircaloy-2en_US
dc.subject.lcshZirconium alloysen_US
dc.subject.lcshIntermetallic compoundsen_US
dc.subject.lcshTransmission electron microscopesen_US
dc.subject.lcshScanning electron microscopesen_US
dc.titleAn analysis of second phase particles in zircaloy 2en_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineering
dc.identifier.oclc07833047en_US


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