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dc.contributor.advisorJames B. Rice, Jr.en_US
dc.contributor.authorCassett, David Ian, 1971-en_US
dc.contributor.authorHopeman, Christopher William Chiu, 1976-en_US
dc.contributor.otherMassachusetts Institute of Technology. Engineering Systems Division.en_US
dc.date.accessioned2005-09-26T20:48:31Z
dc.date.available2005-09-26T20:48:31Z
dc.date.copyright2004en_US
dc.date.issued2004en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/28503
dc.descriptionThesis (M. Eng. in Logistics)--Massachusetts Institute of Technology, Engineering Systems Division, 2004.en_US
dc.descriptionIncludes bibliographical references (p. 87).en_US
dc.description.abstractRadio frequency identification (RFID) has an enormous potential impact within the semiconductor supply chain, especially within semiconductor manufacturing. The end benefit of RFID will be in the mass serialization, and the subsequent tracking and tracing, of individual semiconductors, or what is referred to as Unit Level Traceability (ULT). Before all of the technical hurdles of ULT are overcome, however, there exists a host of other applications for RFID within semiconductor manufacturing. The identification of what can and what should be RFID-tagged and read, the analysis of how to collect this information and what to do with the data, and the implementation of some targeted opportunities will provides valuable information with regards to the technical and logistical hurdles of RFID within semiconductor manufacturing far before ULT becomes a reality.en_US
dc.description.statementofresponsibilityby David Ian Cassett [and] Christopher William Chiu Hopeman.en_US
dc.format.extent97 p.en_US
dc.format.extent5347915 bytes
dc.format.extent5358976 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectEngineering Systems Division.en_US
dc.titleRadio frequency identification (RFID) applications in semiconductor manufacturingen_US
dc.title.alternativeRadio frequency identification applications in semiconductor manufacturingen_US
dc.typeThesisen_US
dc.description.degreeM.Eng.in Logisticsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Engineering Systems Division
dc.identifier.oclc57308319en_US


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