| dc.contributor.advisor | Francisco Stellacci. | en_US |
| dc.contributor.author | Stone, Peter (Peter Robert) | en_US |
| dc.contributor.other | Massachusetts Institute of Technology. Dept. of Materials Science and Engineering. | en_US |
| dc.date.accessioned | 2006-05-15T20:34:54Z | |
| dc.date.available | 2006-05-15T20:34:54Z | |
| dc.date.copyright | 2005 | en_US |
| dc.date.issued | 2005 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/32855 | |
| dc.description | Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2005. | en_US |
| dc.description | Includes bibliographical references (leaf 37). | en_US |
| dc.description.abstract | The harmonic force balance method was used to model and simulate electric force microscopy (EFM) and electrostatically generated phase difference in tapping mode AFM (EPTA) measurements. Simulations show that the harmonic force balance approach matches and explains EFM and EPTA experimental results well. Simulations also show that the model depended on both geometric and materials parameters. The harmonic force balance model was subsequently used to directly simulate a previously performed EPTA experiment. Data obtained from the model showed a remarkable similarity to the experimentally obtained data, thus validating the use of the harmonic force balance model to simulate EPTA data. | en_US |
| dc.description.statementofresponsibility | by Peter Stone. | en_US |
| dc.format.extent | 37 leaves | en_US |
| dc.format.extent | 1632936 bytes | |
| dc.format.extent | 1632286 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
| dc.subject | Materials Science and Engineering. | en_US |
| dc.title | A new model for electric force microscopy and its application for electrostatically generated phase difference in tapping mode AFM | en_US |
| dc.title.alternative | New model for EFM microscopy and its application for electrostatically generated phase difference in tapping mode Atomic Force Microscope | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | S.B. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | |
| dc.identifier.oclc | 61463184 | en_US |
