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Functional testing of ASICs designed with hardware description languages

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Title: Functional testing of ASICs designed with hardware description languages
Author: Davis, Richard Christopher
Advisor: G. Andrew Boughton.
Department: Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science
Publisher: Massachusetts Institute of Technology
Issue Date: 1995
Description: Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.Includes bibliographical references (p. 99).
URI: http://hdl.handle.net/1721.1/36606
Keywords: Electrical Engineering and Computer Science

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