A framework for non-intrusive load monitoring and diagnostics
Author(s)
Paris, James, Ph. D. Massachusetts Institute of Technology
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Other Contributors
Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.
Advisor
Steven B. Leeb and Robert W. Cox.
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The widespread use of electrical and electromechanical systems places increasing demands on monitoring and diagnostic techniques. The non-intrusive load monitor (NILM) provides a low-cost, low-maintenance way to perform this monitoring and diagnostics from a centralized location. This work critically evaluates the current state of the NILM hardware and software in order to develop new techniques and a new hardware and software framework in which to better apply the NILM to real-world systems. New diagnostic indicators are developed on the USCGC SENECA using an improved hardware and software platform. A database-driven framework with the flexibility to create and implement these and future diagnostic indicators is presented.
Description
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2006. Includes bibliographical references (p. 259-260).
Date issued
2006Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer SciencePublisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science.