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Acquisition and modeling of material appearance

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dc.contributor.advisor Frédo Durand. en_US
dc.contributor.author Ngan, Wai Kit Addy, 1979- en_US
dc.contributor.other Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. en_US
dc.date.accessioned 2008-01-10T17:22:07Z
dc.date.available 2008-01-10T17:22:07Z
dc.date.copyright 2006 en_US
dc.date.issued 2006 en_US
dc.identifier.uri http://dspace.mit.edu/handle/1721.1/38307 en_US
dc.identifier.uri http://hdl.handle.net/1721.1/38307
dc.description Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2006. en_US
dc.description Includes bibliographical references (p. 131-143). en_US
dc.description.abstract In computer graphics, the realistic rendering of synthetic scenes requires a precise description of surface geometry, lighting, and material appearance. While 3D geometry scanning and modeling have advanced significantly in recent years, measurement and modeling of accurate material appearance have remained critical challenges. Analytical models are the main tools to describe material appearance in most current applications. They provide compact and smooth approximations to real materials but lack the expressiveness to represent complex materials. Data-driven approaches based on exhaustive measurements are fully general but the measurement process is difficult and the storage requirement is very high. In this thesis, we propose the use of hybrid representations that are more compact and easier to acquire than exhaustive measurement, while preserving much generality of a data-driven approach. To represent complex bidirectional reflectance distribution functions (BRDFs), we present a new method to estimate a general microfacet distribution from measured data. We show that this representation is able to reproduce complex materials that are impossible to model with purely analytical models. en_US
dc.description.abstract (cont.) We also propose a new method that significantly reduces measurement cost and time of the bidirectional texture function (BTF) through a statistical characterization of texture appearance. Our reconstruction method combines naturally aligned images and alignment-insensitive statistics to produce visually plausible results. We demonstrate our acquisition system which is able to capture intricate materials like fabrics in less than ten minutes with commodity equipments. In addition, we present a method to facilitate effective user design in the space of material appearance. We introduce a metric in the space of reflectance which corresponds roughly to perceptual measures. The main idea of our approach is to evaluate reflectance differences in terms of their induced rendered images, instead of the reflectance function itself defined in the angular domains. With rendered images, we show that even a simple computational metric can provide good perceptual spacing and enable intuitive navigation of the reflectance space. en_US
dc.description.statementofresponsibility by Wai Kit Addy Ngan. en_US
dc.format.extent 143 p. en_US
dc.language.iso eng en_US
dc.publisher Massachusetts Institute of Technology en_US
dc.rights M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. en_US
dc.rights.uri http://dspace.mit.edu/handle/1721.1/38307 en_US
dc.rights.uri http://dspace.mit.edu/handle/1721.1/7582
dc.subject Electrical Engineering and Computer Science. en_US
dc.title Acquisition and modeling of material appearance en_US
dc.type Thesis en_US
dc.description.degree Ph.D. en_US
dc.contributor.department Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. en_US
dc.identifier.oclc 153954904 en_US


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