Siebert, William M.; Peake, William T.; Weiss, Thomas F.; Braida, Louis D.; Durlach, Nathaniel I.; Lim, Jae S.; Purks, Steven R.; Rabinowitz, William M.; Colburn, H. Steven; Domnitz, Robert H.; Ruotolo, B. Robert; Stern, Richard M., Jr.; Bahler, Lawrence G.; Beguesse, Ian M.; Gluss, David H.; Hicks, Bruce L.; Lippmann, Richard P.; Perlmutter, Yvonne M.; Rabinowitz, William M.; Reed, Charlotte M.; Schultz, Martin C.; Golub, Howard L.; Houtsma, Adrian J. M.; Wicke, Roger W.; Boland, Robert P. W.; Adler, Nicholas B.; Siebert, Peter W.; Frishkopf, Lawrence S.; Oman, Charles M.; Peterson, Scott K.; Tole, John R.; Rhyne, Theodore L.; Wiegner, Allen W.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1976-01)