Browsing RLE Progress Report, No. 133 (1990) by Subject "Semiconductor Surface Studies"

Now showing items 1-2 of 2

    • Semiconductor Surface Studies 

      Joannopoulos, John D.; Kaxiras, Efthimios; Alerhand, Oscar L.; Meade, Robert D.; Arias, Tomas A.; e.a. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1990-01-01)

    • Synchrotron X-Ray Studies of Surface Disordering 

      Birgeneau, Robert J.; Blum, Kenneth I.; Mak, Alan; Noh, Do-Young; Nuttall, William J.; e.a. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1990-01-01)