Kiang, Nelson Y-S.; Peake, William T.; Siebert, William M.; Weiss, Thomas F.; Braida, Louis D.; Durlach, Nathaniel I.; MacMillan, Neil A.; Rabinowitz, William M.; Bristol, Norman, Jr.; Bustamante, Diane K.; Foss, Kristin K.; Freeman, Dennis M.; Hildebrandt, Eric M.; Milner, Paul; Peterson, Patrick M.; Posen, Miles P.; Reed, Charlotte M.; Russell, Roy P., Jr.; Uchanski, Rosalie M.; Villchur, Edgar; Zue, Victor W.; Zurek, Patrick M.; Boduch, Raymond; Coker, Jackie; Delhorne, Lorraine A.; Dowdy, Leonard C.; Rohlicek, Robin; Schultz, Martin C.; Skarda, Gregory M.; Farrar, Catherine L.; Florentine, Mary S.; Ito, Yoshiko; Frishkopf, Lawrence S.; DeRosier, David J.; Oman, Charles M.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1983-01)