| dc.contributor.author |
Kim, Hyoung-June |
en_US |
| dc.contributor.author |
Palmer, Joyce E. |
en_US |
| dc.contributor.author |
Atwater, Harry A. |
en_US |
| dc.contributor.author |
Thompson, Carl V. |
en_US |
| dc.contributor.author |
Smith, Henry I. |
en_US |
| dc.contributor.author |
Jiran, Eva |
en_US |
| dc.contributor.author |
Tomita, Hisashi |
en_US |
| dc.contributor.author |
Im, James S. |
en_US |
| dc.contributor.author |
Schott, Stephen C. |
en_US |
| dc.contributor.author |
Wong, Chee C. |
en_US |
| dc.contributor.author |
Garrison, Stephen M. |
en_US |
| dc.contributor.author |
Smith, David A. |
en_US |
| dc.contributor.author |
Cammarata, Robert C. |
en_US |
| dc.contributor.author |
Clevenger, Lawrence A. |
en_US |
| dc.contributor.author |
Tu, King-Ning |
en_US |
| dc.contributor.author |
Frost, Harold J. |
en_US |
| dc.contributor.author |
Maorino, Cesar D. |
en_US |
| dc.contributor.author |
Longworth, Hai P. |
en_US |
| dc.contributor.author |
Privost, Lawrence |
en_US |
| dc.contributor.author |
Cho, Jaeshin |
en_US |
| dc.date.accessioned |
2010-07-15T22:08:13Z |
|
| dc.date.available |
2010-07-15T22:08:13Z |
|
| dc.date.issued |
1986-01 |
en_US |
| dc.identifier |
RLE_PR_128_02 |
en_US |
| dc.identifier.uri |
http://hdl.handle.net/1721.1/56955 |
|
| dc.description |
Contains reports on nine research projects. |
en_US |
| dc.description.sponsorship |
National Science Foundation (Grant ECS85-06565) |
en_US |
| dc.description.sponsorship |
Semiconductor Research Corporation |
en_US |
| dc.description.sponsorship |
U.S. Air Force - Office of Scientific Research (Grant AFOSR-85-0154) |
en_US |
| dc.description.sponsorship |
National Science Foundation (Grant DMR81-19285) |
en_US |
| dc.description.sponsorship |
Sony International Business Machines, Inc. |
en_US |
| dc.description.sponsorship |
Dartmouth University |
en_US |
| dc.description.sponsorship |
Joint Services Electronics Program (Contract DAAG29-83-K-0003) |
en_US |
| dc.description.sponsorship |
Semiconductor Research Corporation |
en_US |
| dc.language.iso |
en |
en_US |
| dc.publisher |
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
en_US |
| dc.relation.ispartof |
Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1986 |
en_US |
| dc.relation.ispartof |
Kinetic Phenomena in Thin Film Electronic Materials |
en_US |
| dc.relation.ispartofseries |
Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 128 |
en_US |
| dc.rights |
Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. |
en_US |
| dc.subject.other |
Kinetic Phenomena in Thin Film Electronic Materials |
en_US |
| dc.subject.other |
Surface-Energy-Driven Secondary Grain Growth in Ultrathin (˂1000Å) Films of Silicon |
en_US |
| dc.subject.other |
Surface-Energy-Driven Secondary Grain Growth in Ultrathin (˂1000Å) Films of Germanium |
en_US |
| dc.subject.other |
Metastable Phase Formation in Lithographically Defined Particles of Semiconductors |
en_US |
| dc.subject.other |
Zone Melting Recrystallization of Silicon Films |
en_US |
| dc.subject.other |
Zone Melting Recrystallization of Germanium Films |
en_US |
| dc.subject.other |
Graphoepitaxy of Si |
en_US |
| dc.subject.other |
Graphoepitaxy of Ge |
en_US |
| dc.subject.other |
Graphoepitaxy of Model Materials |
en_US |
| dc.subject.other |
Properties of Grain Boundaries with Controlled Orientations in Thin Silicon Films |
en_US |
| dc.subject.other |
Properties of Grain Boundaries with Controlled Locations in Thin Silicon Films |
en_US |
| dc.subject.other |
Kinetics of Silicide Formation at Refractory Metal-Silicon Contacts |
en_US |
| dc.subject.other |
Modeling of Grain Formation in Thin Films |
en_US |
| dc.subject.other |
Modeling of Grain Growth in Thin Films |
en_US |
| dc.subject.other |
Grain Growth in Thin Films of Aluminum |
en_US |
| dc.subject.other |
Thin and Narrow Metallic Interconnects |
en_US |
| dc.title |
Kinetic Phenomena in Thin Film Electronic Materials |
en_US |
| dc.type |
Technical Report |
en_US |