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Ultralow Temperature Studies of Electronic Conduction in Submicron Silicon Inversion Layers

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Ultralow Temperature Studies of Electronic Conduction in Submicron Silicon Inversion Layers

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Author: Kastner, Marc A.
Publisher: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Date Issued: 1986-01
Description:
Contains research summary.
URI: http://hdl.handle.net/1721.1/56957
Other Identifiers: RLE_PR_128_11
Is Part Of: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1986
Ultralow Temperature Studies of Electronic Conduction in Submicron Silicon Inversion Layers
Series/Report no.: Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 128
Keywords: Ultralow Temperature Studies of Electronic Conduction in Submicron Silicon Inversion Layers

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