Login

Ultralow-Temperature Measurements of Submicron Devices

Show full item record




Title: Ultralow-Temperature Measurements of Submicron Devices
Author: Kastner, Marc A.; Field, S.; Licini, C.; Face, D.; Meirav, U.; Scott-Thomas, John H. F.; Park, S.
Publisher: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Issue Date: 1987-01
Description: Contains research summary.
URI: http://hdl.handle.net/1721.1/57013
Other Identifiers: RLE_PR_129_11
Is Part Of Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1987
Ultralow-Temperature Measurements of Submicron Devices
Series/Report no.: Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 129
Keywords: Ultralow-Temperature Measurements of Submicron Devices

Files in this item

Files Size Format View
RLE_PR_129_11.pdf 129.7Kb PDF View/Open

This item appears in the following Collection(s)

Show full item record

Search DSpace@MIT


Advanced Search

Browse

My Account

Links