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Ultralow-Temperature Measurements of Submicron Devices

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dc.contributor.author Kastner, Marc A. en_US
dc.contributor.author Field, S. en_US
dc.contributor.author Licini, C. en_US
dc.contributor.author Face, D. en_US
dc.contributor.author Meirav, U. en_US
dc.contributor.author Scott-Thomas, John H. F. en_US
dc.contributor.author Park, S. en_US
dc.date.accessioned 2010-07-16T03:41:09Z
dc.date.available 2010-07-16T03:41:09Z
dc.date.issued 1987-01 en_US
dc.identifier RLE_PR_129_11 en_US
dc.identifier.uri http://hdl.handle.net/1721.1/57013
dc.description Contains research summary. en_US
dc.description.sponsorship Joint Services Electronics Program (Contract DAALO03-86-K-0002) en_US
dc.language.iso en en_US
dc.publisher Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) en_US
dc.relation.ispartof Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1987 en_US
dc.relation.ispartof Ultralow-Temperature Measurements of Submicron Devices en_US
dc.relation.ispartofseries Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 129 en_US
dc.rights Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. en_US
dc.subject.other Ultralow-Temperature Measurements of Submicron Devices en_US
dc.title Ultralow-Temperature Measurements of Submicron Devices en_US
dc.type Technical Report en_US


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