| dc.contributor.author | Kastner, Marc A. | en_US |
| dc.contributor.author | Field, S. | en_US |
| dc.contributor.author | Licini, C. | en_US |
| dc.contributor.author | Face, D. | en_US |
| dc.contributor.author | Meirav, U. | en_US |
| dc.contributor.author | Scott-Thomas, John H. F. | en_US |
| dc.contributor.author | Park, S. | en_US |
| dc.date.accessioned | 2010-07-16T03:41:09Z | |
| dc.date.available | 2010-07-16T03:41:09Z | |
| dc.date.issued | 1987-01 | en_US |
| dc.identifier | RLE_PR_129_11 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/57013 | |
| dc.description | Contains research summary. | en_US |
| dc.description.sponsorship | Joint Services Electronics Program (Contract DAALO03-86-K-0002) | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
| dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1987 | en_US |
| dc.relation.ispartof | Ultralow-Temperature Measurements of Submicron Devices | en_US |
| dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 129 | en_US |
| dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
| dc.subject.other | Ultralow-Temperature Measurements of Submicron Devices | en_US |
| dc.title | Ultralow-Temperature Measurements of Submicron Devices | en_US |
| dc.type | Technical Report | en_US |
