| dc.contributor.author |
Kastner, Marc A. |
en_US |
| dc.contributor.author |
Field, S. |
en_US |
| dc.contributor.author |
Licini, C. |
en_US |
| dc.contributor.author |
Face, D. |
en_US |
| dc.contributor.author |
Meirav, U. |
en_US |
| dc.contributor.author |
Scott-Thomas, John H. F. |
en_US |
| dc.contributor.author |
Park, S. |
en_US |
| dc.date.accessioned |
2010-07-16T03:41:09Z |
|
| dc.date.available |
2010-07-16T03:41:09Z |
|
| dc.date.issued |
1987-01 |
en_US |
| dc.identifier |
RLE_PR_129_11 |
en_US |
| dc.identifier.uri |
http://hdl.handle.net/1721.1/57013 |
|
| dc.description |
Contains research summary. |
en_US |
| dc.description.sponsorship |
Joint Services Electronics Program (Contract DAALO03-86-K-0002) |
en_US |
| dc.language.iso |
en |
en_US |
| dc.publisher |
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
en_US |
| dc.relation.ispartof |
Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1987 |
en_US |
| dc.relation.ispartof |
Ultralow-Temperature Measurements of Submicron Devices |
en_US |
| dc.relation.ispartofseries |
Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 129 |
en_US |
| dc.rights |
Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. |
en_US |
| dc.subject.other |
Ultralow-Temperature Measurements of Submicron Devices |
en_US |
| dc.title |
Ultralow-Temperature Measurements of Submicron Devices |
en_US |
| dc.type |
Technical Report |
en_US |
