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dc.contributor.authorThompson, Carl V.en_US
dc.contributor.authorLiu, Yachinen_US
dc.contributor.authorFloro, Jerrold A.en_US
dc.contributor.authorInglefield, Heather E.en_US
dc.contributor.authorFrost, Harold J.en_US
dc.contributor.authorEvans, Paulen_US
dc.contributor.authorSmith, David A.en_US
dc.contributor.authorMa, Enen_US
dc.contributor.authorMiura, H.en_US
dc.contributor.authorTu, King-Ningen_US
dc.contributor.authorCho, Jaeshinen_US
dc.contributor.authorKahn, Harolden_US
dc.contributor.authorLongworth, Hai P.en_US
dc.contributor.authorMelngailis, Johnen_US
dc.contributor.authorDubner, Andrew D.en_US
dc.contributor.authorRo, Jaesangen_US
dc.contributor.authorEdell, David J.en_US
dc.date.accessioned2010-07-16T04:21:25Z
dc.date.available2010-07-16T04:21:25Z
dc.date.issued1990-01-01 to 1990-12-31en_US
dc.identifierRLE_PR_133_01_01s_02en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/57156
dc.descriptionContains reports on eight research projects and a list of publications.en_US
dc.description.sponsorshipNational Science Foundationen_US
dc.description.sponsorshipU.S. Air Force - Office of Scientific Researchen_US
dc.description.sponsorshipJoint Services Electronics Program Contract DAAL03-89-C-0001en_US
dc.description.sponsorshipIBM Corporationen_US
dc.description.sponsorshipHitachi Corporationen_US
dc.description.sponsorshipSemiconductor Research Corporationen_US
dc.description.sponsorshipNational Institutes of Healthen_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1990en_US
dc.relation.ispartofSolid State Physics, Electronics and Opticsen_US
dc.relation.ispartofMaterials and Fabricationen_US
dc.relation.ispartofMicrostructural Evolution in Thin Films of Electronic Materialsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 133en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherMicrostructural Evolution in Thin Films of Electronic Materialsen_US
dc.subject.otherCoarsening of Particles on a Planar Substrateen_US
dc.subject.otherEpitaxial Grain Growthen_US
dc.subject.otherModeling of Microstructural Evolution in Thin Filmsen_US
dc.subject.otherProperties of Grain Boundaries in Zone Melted Silicon Thin Filmsen_US
dc.subject.otherKinetics of Thin Film Silicide Form ationen_US
dc.subject.otherReliability of Interconnectsen_US
dc.subject.otherMicrostructures of Interconnectsen_US
dc.subject.otherFocused Ion Beam Induced Depositionen_US
dc.subject.otherProtective Coatings for Integrated Circuits in an in vitro Environmenten_US
dc.subject.otherPublicationsen_US
dc.titleMicrostructural Evolution in Thin Films of Electronic Materialsen_US
dc.typeTechnical Reporten_US


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