dc.contributor.author | del Alamo, Jesús A. | en_US |
dc.contributor.author | Bahl, Sandeep R. | en_US |
dc.contributor.author | Moolji, Akbar A. | en_US |
dc.contributor.author | Cudjoe-Flanders, Charmaine A. | en_US |
dc.contributor.author | Odoardi, Angela R. | en_US |
dc.date.accessioned | 2010-07-16T19:21:43Z | |
dc.date.available | 2010-07-16T19:21:43Z | |
dc.date.issued | 1993-01-01 to 1993-12-31 | en_US |
dc.identifier | RLE_PR_136_01_01s_02 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/57250 | |
dc.description | Contains an introduction, reports on two research projects and a list of publications and conference papers. | en_US |
dc.description.sponsorship | Charles S. Draper Laboratories Contract DL-H-441694 | en_US |
dc.description.sponsorship | Joint Services Electronics Program Contract DAAL03-92-C-0001 | en_US |
dc.description.sponsorship | Texas Instruments Agreement dated 08/14/91 | en_US |
dc.language.iso | en | en_US |
dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1993 | en_US |
dc.relation.ispartof | Solid State Physics, Electronics and Optics | en_US |
dc.relation.ispartof | Materials and Fabrication | en_US |
dc.relation.ispartof | Physics of InAIAs/InGaAs Heterostructure Field-Effect Transistors | en_US |
dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 136 | en_US |
dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
dc.subject.other | Physics of InAIAs/InGaAs Heterostructure Field-Effect Transistors | en_US |
dc.subject.other | Physics of Breakdown in InAIAs/InGaAs MODFETs | en_US |
dc.subject.other | Impact Ionization in InAIAs/InGaAs HFETs | en_US |
dc.title | Physics of InAIAs/InGaAs Heterostructure Field-Effect Transistors | en_US |
dc.type | Technical Report | en_US |