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dc.contributor.authordel Alamo, Jesús A.en_US
dc.contributor.authorBahl, Sandeep R.en_US
dc.contributor.authorMoolji, Akbar A.en_US
dc.contributor.authorCudjoe-Flanders, Charmaine A.en_US
dc.contributor.authorOdoardi, Angela R.en_US
dc.date.accessioned2010-07-16T19:21:43Z
dc.date.available2010-07-16T19:21:43Z
dc.date.issued1993-01-01 to 1993-12-31en_US
dc.identifierRLE_PR_136_01_01s_02en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/57250
dc.descriptionContains an introduction, reports on two research projects and a list of publications and conference papers.en_US
dc.description.sponsorshipCharles S. Draper Laboratories Contract DL-H-441694en_US
dc.description.sponsorshipJoint Services Electronics Program Contract DAAL03-92-C-0001en_US
dc.description.sponsorshipTexas Instruments Agreement dated 08/14/91en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1993en_US
dc.relation.ispartofSolid State Physics, Electronics and Opticsen_US
dc.relation.ispartofMaterials and Fabricationen_US
dc.relation.ispartofPhysics of InAIAs/InGaAs Heterostructure Field-Effect Transistorsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 136en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherPhysics of InAIAs/InGaAs Heterostructure Field-Effect Transistorsen_US
dc.subject.otherPhysics of Breakdown in InAIAs/InGaAs MODFETsen_US
dc.subject.otherImpact Ionization in InAIAs/InGaAs HFETsen_US
dc.titlePhysics of InAIAs/InGaAs Heterostructure Field-Effect Transistorsen_US
dc.typeTechnical Reporten_US


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