Heuristic Techniques in Computer Aided Circuit Analysis
Author(s)
Sussman, Gerald Jay; Stallman, Richard Matthew
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We present EL, a new kind of circuit analysis  program. Whereas other circuit analysis  systems rely on classical, formal analysis  techniques, EL employs heuristic "inspection"  methods to solve rather complex DC bias  circuits. These techniques also give EL the  ability to explain any result in terms of its own  qualitative reasoning processes. EL's  reasoning is based on the concept of a "local  one-step deduction" augmented by various  "teleological" principles and by the concept of  a "macro-element". We present several  annotated examples of EL in operation and an  explanation of how it works. We also show  how EL can be extended in several directions,  including sinusoidal steady state analysis.  Finally, we touch on possible implications for  engineering education. We feel that EL is  significant not only as a novel approach to  circuit analysis but also as an application of  Artificial Intelligence techniques to a new and  interesting domain.
Date issued
1975-03-01Other identifiers
AIM-328
Series/Report no.
AIM-328