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dc.contributor.advisorDavid E. Hardt.en_US
dc.contributor.authorDai, Qi, M. Eng. Massachusetts Institute of Technologyen_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Mechanical Engineering.en_US
dc.date.accessioned2011-04-25T16:08:59Z
dc.date.available2011-04-25T16:08:59Z
dc.date.copyright2010en_US
dc.date.issued2010en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/62497
dc.descriptionThesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2010.en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (p. 48-49).en_US
dc.description.abstractThis thesis addresses the quality improvement in a printing process at a food packaging company now experiencing hundreds of printing defects. Methodologies of Define, Measure, Analyze, Improve, and Control (DMAIC), and Response Surface Model were introduced to reduce the defect rate and control the process. As a result, critical inputs were identified, and a statistical regression model was constructed to predict the flaw size by knowing the critical inputs of the process. The mathematical optimal settings were determined to minimize the flaw size. Moreover, advanced control charts were developed to monitor and control the process.en_US
dc.description.statementofresponsibilityby Dai, Qi.en_US
dc.format.extent49 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectMechanical Engineering.en_US
dc.titleQuality improvement and control based on defect reductionen_US
dc.typeThesisen_US
dc.description.degreeM.Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.identifier.oclc712179834en_US


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