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dc.contributor.advisorChristopher Terman and Chris Busick.en_US
dc.contributor.authorTerBush, Ryan (Ryan T.)en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2014-03-06T15:47:17Z
dc.date.available2014-03-06T15:47:17Z
dc.date.copyright2013en_US
dc.date.issued2013en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/85511
dc.descriptionThesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2013.en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (page 52).en_US
dc.description.abstractAs data growth continues to accelerate, so must performance and efficiency of large scale storage systems. This project will present the implementation and performance analysis of Multi-Path I/O within Data ONTAP. The goal of this feature is to take advantage of redundant paths that were previously utilized only in failure situations. The paper will address the core mechanisms that comprise the MPIO handling within the system. Furthermore it will present the difficulties of testing such a feature in a shared lab environment. The initial expectation that MPIO would provide a small performance gain, in addition to better failure handling properties, was affirmed in the results. Under heavy I/O loads, MPIO systems showed an average of 5% throughput improvement over the older single-path implementation.en_US
dc.description.statementofresponsibilityby Ryan TerBush.en_US
dc.format.extent52 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleDevelopment and performance-testing of Multi-Path I/O algorithms on V-Series systemsen_US
dc.typeThesisen_US
dc.description.degreeM. Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc871035814en_US


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