| dc.contributor.advisor | Steven D. Eppinger and Duane S. Boning. | en_US |
| dc.contributor.author | Ingham, Debika (Debika Bhattacharya), 1973- | en_US |
| dc.contributor.other | Leaders for Manufacturing Program. | en_US |
| dc.date.accessioned | 2014-05-23T19:07:29Z | |
| dc.date.available | 2014-05-23T19:07:29Z | |
| dc.date.copyright | 2002 | en_US |
| dc.date.issued | 2002 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/87210 | |
| dc.description | Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science; and, (M.B.A.)--Massachusetts Institute of Technology, Sloan School of Management; in conjunction with the Leaders for Manufacturing Program at MIT, 2002. | en_US |
| dc.description | Includes bibliographical references (p. 72-73). | en_US |
| dc.description.statementofresponsibility | Debika Ingham. | en_US |
| dc.format.extent | 76 p. | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
| dc.subject | Electrical Engineering and Computer Science. | en_US |
| dc.subject | Sloan School of Management. | en_US |
| dc.subject | Leaders for Manufacturing Program. | en_US |
| dc.title | Quality control and improvement in a low-cost, high-clockspeed manufacturing environment | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | S.M. | en_US |
| dc.description.degree | M.B.A. | en_US |
| dc.contributor.department | Leaders for Manufacturing Program at MIT | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| dc.contributor.department | Sloan School of Management | |
| dc.identifier.oclc | 51176188 | en_US |
