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18.443 Statistics for Applications, Spring 2009

Author(s)
Dudley, Richard
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Download18-443-spring-2009/contents/index.htm (33.59Kb)
Alternative title
Statistics for Applications
Terms of use
Usage Restrictions: This site (c) Massachusetts Institute of Technology 2016. Content within individual courses is (c) by the individual authors unless otherwise noted. The Massachusetts Institute of Technology is providing this Work (as defined below) under the terms of this Creative Commons public license ("CCPL" or "license") unless otherwise noted. The Work is protected by copyright and/or other applicable law. Any use of the work other than as authorized under this license is prohibited. By exercising any of the rights to the Work provided here, You (as defined below) accept and agree to be bound by the terms of this license. The Licensor, the Massachusetts Institute of Technology, grants You the rights contained here in consideration of Your acceptance of such terms and conditions. Usage Restrictions: Attribution-NonCommercial-ShareAlike 3.0 Unported http://creativecommons.org/licenses/by-nc-sa/3.0/
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Abstract
This course is a broad treatment of statistics, concentrating on specific statistical techniques used in science and industry. Topics include: hypothesis testing and estimation, confidence intervals, chi-square tests, nonparametric statistics, analysis of variance, regression, correlation, decision theory, and Bayesian statistics. Note: Please see the syllabus for a description of the different versions of 18.443 taught at MIT.
Date issued
2009-06
URI
http://hdl.handle.net/1721.1/100851
Department
Massachusetts Institute of Technology. Department of Mathematics
Other identifiers
18.443-Spring2009
local: 18.443
local: IMSCP-MD5-ce9c680ec71a690f4020890233f2a282
Keywords
hypothesis testing, hypothesis estimation, confidence intervals, chi-square tests, nonparametric statistics, analysis of variance, regression, correlation, decision theory, Bayesian statistics

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