12.141 Electron Microprobe Analysis, January (IAP) 2003
Highlights of this Course
This course is offered during MIT's Independent Activities Period (
IAP) -- a special 4-week term at MIT that runs from the first week of January until the end of the month. The web site includes detailed
lecture notes,
slides,
problems sets, and a
quiz.
Course Description
Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions involve hands-on use of the electron microprobe.
Offered for undergraduate credit, but persons interested in an in-depth discussion of quantitative x-ray analysis are invited to participate. Students will be required to complete lab exercises to obtain credit.