Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials

Miller, Matthew J; Cabral, Matthew J; Dickey, Elizabeth C; LeBeau, James M; Reich, Brian J

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Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials

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Author(s)

Miller, Matthew J

•

Cabral, Matthew J

•

Dickey, Elizabeth C

•

LeBeau, James M

•

Reich, Brian J

Date Issued

2022

Journal

Technometrics

Publisher

Informa UK Limited

Citation

Miller, Matthew J, Cabral, Matthew J, Dickey, Elizabeth C, LeBeau, James M and Reich, Brian J. 2022. "Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials." Technometrics, 64 (1).

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Original manuscript

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Attribution-NonCommercial-ShareAlike 4.0 International

https://creativecommons.org/licenses/by-nc-sa/4.0/

Persistent DSpace Link

https://hdl.handle.net/1721.1/142616

DOI of Published Version

10.1080/00401706.2021.1905070