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Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC

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NSREC2017 - REDW Final Paper - SEE and TID Assessment of Coherent DSP ASIC.pdf

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Accepted version
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1.29 MB

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sword-2019-07-29T18:27:07.original.xml (130 B)
Original SWORD entry document
Author(s)
Aniceto, Raichelle
•
Moro, Slaven
•
Milanowski, Randall
•
Isabelle, Christopher
•
Hall, Norman
•
Vermeire, Bert
•
Cahoy, Kerri
Date Issued
July 2017
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Aniceto, Raichelle, Moro, Slaven, Milanowski, Randall, Isabelle, Christopher, Hall, Norman et al. 2017. "Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC."
Version
Author's final manuscript
Abstract
© 2017 IEEE. Experimental assessment of commercial 100/200 Gbps optical coherent DSP modem ASIC completed with 64 MeV and 480 MeV proton radiation test campaigns. Single event effect cross sections calculated and no performance degradation observed for proton fluence levels up to 1.27×1012 p/cm2 with equivalent total ionizing dose exposure to 170 krad(Si).
Terms of Use
Creative Commons Attribution-Noncommercial-Share Alike
http://creativecommons.org/licenses/by-nc-sa/4.0/
Persistent DSpace Link
https://hdl.handle.net/1721.1/137994
DOI of Published Version
10.1109/nsrec.2017.8115466
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