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Physical redundancy for defect tolerance : example designs and fundamental limits

Author(s)
Tang, Jennifer (Jennifer Susan)
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Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.
Advisor
Yury Polyanskiy.
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M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582
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Abstract
This project analyzes designs for physical redundancy which are modeled abstractly as a bipartite graph. The goal is to determine the characteristics of graph structures which optimize the trade-off between the number of edges and the number of redundant components or nodes needed while correcting a deterministic number of worst-case errors. This thesis looks at finite-sized designs, asymptotically large designs with finite error correcting values, and designs with asymptotically large error correcting values. Results include some small optimal graph structures and fundamental limits on what the optimal design structure can achieve for the cases where a small number of errors are corrected and for where the number of errors to be correctly grows asymptotically.
Description
Thesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2015.
 
Cataloged from PDF version of thesis.
 
Includes bibliographical references (page 75).
 
Date issued
2015
URI
http://hdl.handle.net/1721.1/101588
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Publisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science.

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