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dc.contributor.advisorYury Polyanskiy.en_US
dc.contributor.authorTang, Jennifer (Jennifer Susan)en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2016-03-03T21:10:43Z
dc.date.available2016-03-03T21:10:43Z
dc.date.copyright2015en_US
dc.date.issued2015en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/101588
dc.descriptionThesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2015.en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (page 75).en_US
dc.description.abstractThis project analyzes designs for physical redundancy which are modeled abstractly as a bipartite graph. The goal is to determine the characteristics of graph structures which optimize the trade-off between the number of edges and the number of redundant components or nodes needed while correcting a deterministic number of worst-case errors. This thesis looks at finite-sized designs, asymptotically large designs with finite error correcting values, and designs with asymptotically large error correcting values. Results include some small optimal graph structures and fundamental limits on what the optimal design structure can achieve for the cases where a small number of errors are corrected and for where the number of errors to be correctly grows asymptotically.en_US
dc.description.statementofresponsibilityby Jennifer Tang.en_US
dc.format.extent75 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titlePhysical redundancy for defect tolerance : example designs and fundamental limitsen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc940982539en_US


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