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dc.contributor.advisorJonathan Kelner.en_US
dc.contributor.authorCohen, Michael Benjamin.en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2016-12-05T19:11:19Z
dc.date.available2016-12-05T19:11:19Z
dc.date.copyright2016en_US
dc.date.issued2016en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/105577
dc.descriptionThesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2016.en_US
dc.descriptionThis electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.en_US
dc.descriptionCataloged from student-submitted PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 17-18).en_US
dc.description.abstractWe present a new analysis of sparse oblivious subspace embeddings, based on the "matrix Chernoff" technique. These are probability distributions over (relatively) sparse matrices such that for any d-dimensional subspace of Rn, the norms of all vectors in the subspace are simultaneously approximately preserved by the embedding with high probability-typically with parameters depending on d but not on n. The families of embedding matrices considered here are essentially the same as those in [NN13], but with better parameters (sparsity and embedding dimension). Because of this, this analysis essentially serves as a "drop-in replacement" for Nelson-Nguyen's, improving bounds on its many applications to problems such as as least squares regression and low-rank approximation. This new method is based on elementary tail bounds combined with matrix trace inequalities (Golden-Thompson or Lieb's theorem), and does not require combinatorics, unlike the Nelson-Nguyen approach. There are also variants of this method that are even simpler, at the cost of worse parameters. Furthermore, the bounds obtained are much tighter than previous ones, matching known lower bounds up to a single log(d) factor in embedding dimension (previous results had more log factors and also had suboptimal tradeoffs with sparsity).en_US
dc.description.statementofresponsibilityby Michael B. Cohen.en_US
dc.format.extent24 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleNearly tight oblivious subspace embeddings by trace inequalitiesen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc964450957en_US


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