Development of a beamline system for characterization of X-ray and neutron optics
Name
963177784-MIT.pdf
Description
Full printable version
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9.14 MB
Format
Adobe PDF
Checksum (MD5)
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Author(s)
Ames, Andrew O. (Andrew Owen)
Advisor(s)
Suzanne Romaine and Marshall Bautz.
Date Issued
2016
Publisher
Massachusetts Institute of Technology
Abstract
In this thesis, I present a beamline system designed and built at the Harvard-Smithsonian Center for Astrophysics (CfA) to measure the reflectivity and resolution of small diameter multilayer coated Wolter optics. These optics, used for imaging of x-rays and neutrons, have numerous applications in areas such as medicine, fusion research and planetary science. The beamline consists of a divergent x-ray source, an energy sensitive detector, and a set of precise, computer controlled motorized stages for alignment. A dedicated software package was developed to interface with the detector and stages using the Python programming language. The beamline was used to measure the reflectivity and spatial resolution of two x-ray optics recently fabricated at the CfA. These results are presented and compared with theoretical models for reflectivity from a multilayer surface.
Description
Thesis: S.B., Massachusetts Institute of Technology, Department of Physics, 2016.
Cataloged from PDF version of thesis.
Includes bibliographical references (pages 69-71).
Subjects
Physics.
MIT Department
Massachusetts Institute of Technology. Department of Physics
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