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dc.contributor.advisorSuzanne Romaine and Marshall Bautz.en_US
dc.contributor.authorAmes, Andrew O. (Andrew Owen)en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Physics.en_US
dc.date.accessioned2016-12-05T19:55:33Z
dc.date.available2016-12-05T19:55:33Z
dc.date.copyright2016en_US
dc.date.issued2016en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/105627
dc.descriptionThesis: S.B., Massachusetts Institute of Technology, Department of Physics, 2016.en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 69-71).en_US
dc.description.abstractIn this thesis, I present a beamline system designed and built at the Harvard-Smithsonian Center for Astrophysics (CfA) to measure the reflectivity and resolution of small diameter multilayer coated Wolter optics. These optics, used for imaging of x-rays and neutrons, have numerous applications in areas such as medicine, fusion research and planetary science. The beamline consists of a divergent x-ray source, an energy sensitive detector, and a set of precise, computer controlled motorized stages for alignment. A dedicated software package was developed to interface with the detector and stages using the Python programming language. The beamline was used to measure the reflectivity and spatial resolution of two x-ray optics recently fabricated at the CfA. These results are presented and compared with theoretical models for reflectivity from a multilayer surface.en_US
dc.description.statementofresponsibilityby Andrew O. Ames.en_US
dc.format.extent71 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectPhysics.en_US
dc.titleDevelopment of a beamline system for characterization of X-ray and neutron opticsen_US
dc.typeThesisen_US
dc.description.degreeS.B.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physics
dc.identifier.oclc963177784en_US


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