A data-driven approach to improving capacity utilization of semiconductor test equipment

Author(s)
Bailey, Roberta L. (Roberta Lynn)
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Advisor
Charles Sodini, Stephen Graves.
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Description
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996.
 
Includes bibliographical references (p. 77).
 
Date issued
1996
URI
http://hdl.handle.net/1721.1/10567
Department
Sloan School of Management
Publisher
Massachusetts Institute of Technology
Keywords
Sloan School of Management
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