A data-driven approach to improving capacity utilization of semiconductor test equipment
Author(s)Bailey, Roberta L. (Roberta Lynn)
Charles Sodini, Stephen Graves.
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Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996.Includes bibliographical references (p. 77).
DepartmentSloan School of Management
Massachusetts Institute of Technology
Sloan School of Management