| dc.contributor.advisor | Charles Sodini, Stephen Graves. | en_US |
| dc.contributor.author | Bailey, Roberta L. (Roberta Lynn) | en_US |
| dc.date.accessioned | 2005-08-18T16:55:24Z | |
| dc.date.available | 2005-08-18T16:55:24Z | |
| dc.date.copyright | 1996 | en_US |
| dc.date.issued | 1996 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/10567 | |
| dc.description | Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996. | en_US |
| dc.description | Includes bibliographical references (p. 77). | en_US |
| dc.description.statementofresponsibility | by Roberta L. Bailey. | en_US |
| dc.format.extent | 88 p. | en_US |
| dc.format.extent | 7771489 bytes | |
| dc.format.extent | 7771243 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
| dc.subject | Sloan School of Management | en_US |
| dc.title | A data-driven approach to improving capacity utilization of semiconductor test equipment | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | M.S. | en_US |
| dc.contributor.department | Sloan School of Management | en_US |
| dc.identifier.oclc | 36028585 | en_US |
