DLTS characterization of aluminum gettering of iron contaminants in boron-doped silicon
Author(s)Thienprasit, Jeanne A. (Jeanne Athya)
Deep level transient spectrosopy of aluminum gettering of iron contaminants in boron-doped silicon.
David K. Roylance.
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Thesis (B.S.)--Massachusetts Institute of Technology, Dept. of Physics, 1996.Includes bibliographical references.
DepartmentMassachusetts Institute of Technology. Dept. of Physics
Massachusetts Institute of Technology