DLTS characterization of aluminum gettering of iron contaminants in boron-doped silicon

Author(s)
Thienprasit, Jeanne A. (Jeanne Athya)
Thumbnail
DownloadFull printable version (1.395Mb)
Alternative title
Deep level transient spectrosopy of aluminum gettering of iron contaminants in boron-doped silicon.
Advisor
David K. Roylance.
Terms of use
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582
Metadata
Show full item record
Description
Thesis (B.S.)--Massachusetts Institute of Technology, Dept. of Physics, 1996.
 
Includes bibliographical references.
 
Date issued
1996
URI
http://hdl.handle.net/1721.1/10613
Department
Massachusetts Institute of Technology. Department of Physics
Publisher
Massachusetts Institute of Technology
Keywords
Physics
Collections