Show simple item record

DLTS characterization of aluminum gettering of iron contaminants in boron-doped silicon

dc.contributor.advisorDavid K. Roylance.en_US
dc.contributor.authorThienprasit, Jeanne A. (Jeanne Athya)en_US
dc.date.accessioned2005-08-18T17:16:14Z
dc.date.available2005-08-18T17:16:14Z
dc.date.copyright1996en_US
dc.date.issued1996en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/10613
dc.descriptionThesis (B.S.)--Massachusetts Institute of Technology, Dept. of Physics, 1996.en_US
dc.descriptionIncludes bibliographical references.en_US
dc.description.statementofresponsibilityby Jeanne A. Thienprasit.en_US
dc.format.extent17 leavesen_US
dc.format.extent1463761 bytes
dc.format.extent1463521 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectPhysicsen_US
dc.titleDLTS characterization of aluminum gettering of iron contaminants in boron-doped siliconen_US
dc.title.alternativeDeep level transient spectrosopy of aluminum gettering of iron contaminants in boron-doped silicon.en_US
dc.typeThesisen_US
dc.description.degreeB.S.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physics
dc.identifier.oclc36228790en_US


Files in this item

Thumbnail
Name:
36228790-MIT.pdf
Size:
1.395Mb
Format:
PDF
Description:
Full printable version
View/Open

This item appears in the following Collection(s)

Show simple item record