Multiscale hypothesis testing with application to anomaly characterization from tomographic projections
Author(s)
Frakt, Austin B. (Austin Berk)![Thumbnail](/bitstream/handle/1721.1/11023/35968351-MIT.pdf.jpg?sequence=5&isAllowed=y)
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Advisor
Alan S. Willsky, W. Clem Karl.
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Show full item recordDescription
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996. Includes bibliographical references (p. 151-155).
Date issued
1996Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer SciencePublisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science