dc.contributor.advisor | Alan S. Willsky, W. Clem Karl. | en_US |
dc.contributor.author | Frakt, Austin B. (Austin Berk) | en_US |
dc.date.accessioned | 2005-08-18T16:02:30Z | |
dc.date.available | 2005-08-18T16:02:30Z | |
dc.date.copyright | 1996 | en_US |
dc.date.issued | 1996 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/11023 | |
dc.description | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996. | en_US |
dc.description | Includes bibliographical references (p. 151-155). | en_US |
dc.description.statementofresponsibility | by Austin B. Frakt. | en_US |
dc.format.extent | 155 p. | en_US |
dc.format.extent | 11652066 bytes | |
dc.format.extent | 11651822 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | application/pdf | |
dc.language.iso | eng | en_US |
dc.publisher | Massachusetts Institute of Technology | en_US |
dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
dc.subject | Electrical Engineering and Computer Science | en_US |
dc.title | Multiscale hypothesis testing with application to anomaly characterization from tomographic projections | en_US |
dc.type | Thesis | en_US |
dc.description.degree | M.S. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
dc.identifier.oclc | 35968351 | en_US |