Characterizing Boolean satisfiability variants
Name
1145012343-MIT.pdf
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695.54 KB
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Adobe PDF
Checksum (MD5)
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Author(s)
Ferreira Antunes Filho, Ivan Tadeu.
Advisor(s)
Erik Demaine.
Date Issued
2019
Publisher
Massachusetts Institute of Technology
Abstract
We survey variants of the Boolean Satisfiability problem from over the years and organize them in what we believe to be the most comprehensive list of known results in SAT variants. We propose a new notation to specify them so that the problems can be compared with no ambiguities, and so that new problems can be more easily identified. We also show hardness of many new variants of SAT including a characterization of Sin-k SAT, hardness of variants of MAX Planar SAT, partial characterization of XNF SAT, consequences of the Ordered Planar Dichotomy, and hardness of NAE SAT variants with a bounded number of variable occurrences, in particular NAE EkSAT-k. This is joint work with Aviv Adler, Leo Alcock, Anastasiia Alokhina, Joshua Ani, Jeffrey Bosboom, Erik Demaine, Yevhenii Diomidov, Jonathan Gabor, Yuzhou Gu, Linus Hamilton, Mirai Ikebuchi, Adam Hesterberg, Jayson Lynch, Zhezheng Luo, Xiao Mao, Kevin Sun, John Urschel, Yinzhan Xu, and Lillian Zhang.
Description
This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.
Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2019
Cataloged from student-submitted PDF version of thesis.
Includes bibliographical references (pages 65-70) and index.
Subjects
Electrical Engineering and Computer Science.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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