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dc.contributor.advisorErik Demaine.en_US
dc.contributor.authorFerreira Antunes Filho, Ivan Tadeu.en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2020-03-24T15:35:55Z
dc.date.available2020-03-24T15:35:55Z
dc.date.copyright2019en_US
dc.date.issued2019en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/124241
dc.descriptionThis electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.en_US
dc.descriptionThesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2019en_US
dc.descriptionCataloged from student-submitted PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 65-70) and index.en_US
dc.description.abstractWe survey variants of the Boolean Satisfiability problem from over the years and organize them in what we believe to be the most comprehensive list of known results in SAT variants. We propose a new notation to specify them so that the problems can be compared with no ambiguities, and so that new problems can be more easily identified. We also show hardness of many new variants of SAT including a characterization of Sin-k SAT, hardness of variants of MAX Planar SAT, partial characterization of XNF SAT, consequences of the Ordered Planar Dichotomy, and hardness of NAE SAT variants with a bounded number of variable occurrences, in particular NAE EkSAT-k. This is joint work with Aviv Adler, Leo Alcock, Anastasiia Alokhina, Joshua Ani, Jeffrey Bosboom, Erik Demaine, Yevhenii Diomidov, Jonathan Gabor, Yuzhou Gu, Linus Hamilton, Mirai Ikebuchi, Adam Hesterberg, Jayson Lynch, Zhezheng Luo, Xiao Mao, Kevin Sun, John Urschel, Yinzhan Xu, and Lillian Zhang.en_US
dc.description.statementofresponsibilityby Ivan Tadeu Ferreira Antunes Filho [and 19 others].en_US
dc.format.extent72 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleCharacterizing Boolean satisfiability variantsen_US
dc.typeThesisen_US
dc.description.degreeM. Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.oclc1145012343en_US
dc.description.collectionM.Eng. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Scienceen_US
dspace.imported2020-03-24T15:35:54Zen_US
mit.thesis.degreeMasteren_US
mit.thesis.departmentEECSen_US


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