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dc.contributor.advisorTomás Palacios.en_US
dc.contributor.authorXie, Qingyun,S.M.Massachusetts Institute of Technology.en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2020-09-15T21:58:17Z
dc.date.available2020-09-15T21:58:17Z
dc.date.copyright2020en_US
dc.date.issued2020en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/127444
dc.descriptionThesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, May, 2020en_US
dc.descriptionCataloged from the official PDF of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 75-88).en_US
dc.description.abstractCryogenic and high frequency electronics have received renewed attention due to their application in the control and readout electronics of quantum computing systems, among others. The potential of AlGaN/GaN HEMTs for cryogenic high frequency application was explored. The performance of AlGaN/GaN HEMTs with both conventional gate material (Ni/Au) and superconducting gate material (NbN) was studied at cryogenic temperature. Furthermore, in order to study device-circuit interaction of the devices, a simulation framework bridging the device-level and circuit-level was developed. The framework was tested on two device concepts, namely GaN p-channel FETs for complementary logic application and the vertical fin transistor for high power RF application.en_US
dc.description.statementofresponsibilityby Qingyun Xie.en_US
dc.format.extent88 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleGallium Nitride electronics for cryogenic and high frequency applicationsen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.oclc1192966396en_US
dc.description.collectionS.M. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Scienceen_US
dspace.imported2020-09-15T21:58:17Zen_US
mit.thesis.degreeMasteren_US
mit.thesis.departmentEECSen_US


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