Reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool

Author(s)
Lee, Deishin
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Advisor
David H. Staelin and Roy E. Welsch.
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Description
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, and (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1992.
 
Includes bibliographical references (leaf 59).
 
Date issued
1992
URI
http://hdl.handle.net/1721.1/12762
Department
Sloan School of Management; Massachusetts Institute of Technology. Department of Mechanical Engineering
Publisher
Massachusetts Institute of Technology
Keywords
Mechanical Engineering, Sloan School of Management
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