| dc.contributor.advisor | David H. Staelin and Roy E. Welsch. | en_US |
| dc.contributor.author | Lee, Deishin | en_US |
| dc.date.accessioned | 2005-08-15T18:29:14Z | |
| dc.date.available | 2005-08-15T18:29:14Z | |
| dc.date.copyright | 1992 | en_US |
| dc.date.issued | 1992 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/12762 | |
| dc.description | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, and (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1992. | en_US |
| dc.description | Includes bibliographical references (leaf 59). | en_US |
| dc.description.statementofresponsibility | by Deishin Lee. | en_US |
| dc.format.extent | 76 leaves | en_US |
| dc.format.extent | 5673357 bytes | |
| dc.format.extent | 5673114 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
| dc.subject | Mechanical Engineering | en_US |
| dc.subject | Sloan School of Management | en_US |
| dc.title | Reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | M.S. | en_US |
| dc.contributor.department | Sloan School of Management | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Mechanical Engineering | |
| dc.identifier.oclc | 27030749 | en_US |
