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dc.contributor.advisorOliver, WIlliam D.
dc.contributor.authorSamach, Gabriel Orr
dc.date.accessioned2022-01-14T15:01:23Z
dc.date.available2022-01-14T15:01:23Z
dc.date.issued2021-06
dc.date.submitted2021-06-24T19:39:30.226Z
dc.identifier.urihttps://hdl.handle.net/1721.1/139283
dc.description.abstractInformation loss in experimental quantum devices is traditionally characterized using metrics such as T₁ and T₂, which are readily accessible from standard time-domain measurement. While T₁ and T₂ times provide rough heuristics for interaction between single qubits and their lossy environments, these numbers stand in as mere proxies for the full multi-qubit loss channel of interest, which can be described more fully with a Lindbladian operator in the master equation formalism. In this thesis, I outline and present the results of the first experimental demonstration of Lindblad Tomography, a novel technique for tomographically reconstructing the Hamiltonian and Lindbladian operators of an arbitrary quantum channel from an ensemble of time-domain measurements. Starting from a theoretically minimal set of assumptions, I show that this method is resilient to state-preparation and measurement (SPAM) errors and places strong bounds on the degree of non-Markovianity in the channel of interest. Comparing the results for single- and two-qubit tomography of a superconducting quantum processor, I demonstrate how Lindblad Tomography can be used to identify sources of crosstalk on large quantum processors, particularly in the presence of always-on qubit-qubit interactions.
dc.publisherMassachusetts Institute of Technology
dc.rightsIn Copyright - Educational Use Permitted
dc.rightsCopyright MIT
dc.rights.urihttp://rightsstatements.org/page/InC-EDU/1.0/
dc.titleExperimental Demonstration of Lindblad Tomography on a Superconducting Quantum Device
dc.typeThesis
dc.description.degreeS.M.
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
mit.thesis.degreeMaster
thesis.degree.nameMaster of Science in Electrical Engineering and Computer Science


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