Measurement of electron drift velocity in MOSFET inversion layers at high electric fields

Author(s)
Bair, Lawrence A.
Thumbnail
Download15688051-MIT.pdf (14.85Mb)
Other Contributors
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.
Terms of use
MIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided. http://dspace.mit.edu/handle/1721.1/7582
Metadata
Show full item record
Description
Thesis: M.S., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 1986
 
Bibliography: leaves 64-65.
 
Date issued
1986
URI
https://hdl.handle.net/1721.1/145868
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Publisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science.
Collections