| dc.contributor.author | Bair, Lawrence A. | en_US |
| dc.contributor.other | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. | en_US |
| dc.date.accessioned | 2022-10-17T20:00:55Z | |
| dc.date.available | 2022-10-17T20:00:55Z | |
| dc.date.copyright | 1986 | en_US |
| dc.date.issued | 1986 | en_US |
| dc.identifier.uri | https://hdl.handle.net/1721.1/145868 | |
| dc.description | Thesis: M.S., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 1986 | en_US |
| dc.description | Bibliography: leaves 64-65. | en_US |
| dc.description.statementofresponsibility | by Lawrence A. Bair. | en_US |
| dc.format.extent | [1], 69 leaves | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | MIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
| dc.subject | Electrical Engineering and Computer Science. | en_US |
| dc.title | Measurement of electron drift velocity in MOSFET inversion layers at high electric fields | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | M.S. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.identifier.oclc | 15688051 | en_US |
| dc.description.collection | M.S. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science | en_US |
| dspace.imported | 2022-10-17T20:00:55Z | en_US |
| mit.thesis.degree | Master | en_US |
