Show simple item record

dc.contributor.advisorVincent W.S. Chan and Muriel Médard.en_US
dc.contributor.authorWeichenberg, Guy E. (Guy Elli), 1978-en_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2005-05-19T15:22:41Z
dc.date.available2005-05-19T15:22:41Z
dc.date.copyright2003en_US
dc.date.issued2003en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/16943
dc.descriptionThesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2003.en_US
dc.descriptionIncludes bibliographical references (p. 157-165).en_US
dc.descriptionThis electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.en_US
dc.description.abstractIn this thesis, we develop a methodology for architecting high-reliability communication networks. Previous results in the network reliability field are mostly theoretical in nature with little immediate applicability to the design of real networks. We bring together these contributions and develop new results and insights which are of value in designing networks that meet prescribed levels of reliability. Furthermore, most existing results assume that component failures are statistically independent in nature. We take initial steps in developing a methodology for the design of networks with statistically dependent link failures. We also study the architectures of networks under extreme stress.en_US
dc.description.statementofresponsibilityby Guy E. Weichenberg.en_US
dc.format.extent165 p.en_US
dc.format.extent900761 bytes
dc.format.extent900510 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleHigh-reliability architectures for networks under stressen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc53245942en_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record