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dc.contributor.advisorC.V. Thompson, II.en_US
dc.contributor.authorHuguenin, S. Caroleneen_US
dc.date.accessioned2005-06-02T14:42:56Z
dc.date.available2005-06-02T14:42:56Z
dc.date.copyright1994en_US
dc.date.issued1994en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/17389
dc.descriptionThesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1994.en_US
dc.descriptionIncludes bibliographical references (leaves 58-59).en_US
dc.description.statementofresponsibilityby S. Carolene Huguenin.en_US
dc.format.extent59 leavesen_US
dc.format.extent4188909 bytes
dc.format.extent4193428 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectMaterials Science and Engineeringen_US
dc.titleElectrostatic deflection of free-standing tungsten microbridges as a novel means for characterization of thin film mechanical propertiesen_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineering
dc.identifier.oclc32031484en_US


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