Raman spectroscopic characterizations of graphene on oxide substrates for remote epitaxy
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105301_1_online.pdf
Description
Published version
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1.06 MB
Format
Adobe PDF
Checksum (MD5)
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Author(s)
Shrestha, S
Chang, CS
Lee, S
Kothalawala, NL
Kim, DY
Minola, M
Kim, J
Seo, A
Date Issued
March 8, 2023
Journal
Journal of Applied Physics
Publisher
AIP Publishing
Citation
S. Shrestha, C. S. Chang, S. Lee, N. L. Kothalawala, D. Y. Kim, M. Minola, J. Kim, A. Seo; Raman spectroscopic characterizations of graphene on oxide substrates for remote epitaxy. J. Appl. Phys. 14 March 2023; 133 (10): 105301.
Version
Final published version
Abstract
Graphene layers placed on SrTiO3 single-crystal substrates, i.e., templates for remote epitaxy of functional oxide membranes, were investigated using temperature-dependent confocal Raman spectroscopy. This approach successfully resolved distinct Raman modes of graphene that are often untraceable in conventional measurements with non-confocal optics due to the strong Raman scattering background of SrTiO3. Information on defects and strain states was obtained for a few graphene/SrTiO3 samples that were synthesized by different techniques. This confocal Raman spectroscopic approach can shed light on the investigation of not only this graphene/SrTiO3 system but also various two-dimensional layered materials whose Raman modes interfere with their substrates.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Massachusetts Institute of Technology. Research Laboratory of Electronics
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1063/5.0143083
